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The use of charged particle bombardment for studying oxygen self-diffusion in oxides

โœ Scribed by J. M. Calvert; D. G. Lees; D. J. Derry; D. Barnes


Book ID
112766531
Publisher
Springer
Year
1972
Tongue
English
Weight
209 KB
Volume
12
Category
Article
ISSN
1588-2780

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Oxygen self-diffusion and surface exchan
โœ P.S. Manning; J.D. Sirman; J.A. Kilner ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 677 KB

## Isotopic Exchange Depth Profiling (IEDP) using Secondary Ion Mass Spectrometry (SIMS) has been used to investigate oxygen self-diffusion and surface exchange reactions in the related fluorites, yttria stabilised zirconia (YSZ) and gadolinia doped ceria (CGO). The nature of the exchange reaction