Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids

✍ Scribed by D. J. DiMaria; Z. A. Weinberg; J. M. Aitken; D. R. Young

• Book ID: 112817473
• Publisher: Springer US
• Year: 1977
• Tongue: English
• Weight: 416 KB
• Volume: 6
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/bf02660485