✦ LIBER ✦
Charge measurements in thin insulating layers of MIS and MIM structures by means of current–voltage characteristics and application to the MOS system
✍ Scribed by Hartmann, U.
- Publisher
- John Wiley and Sons
- Year
- 1977
- Tongue
- English
- Weight
- 476 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0031-8965
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