Use of Normalized Relative Line Intensities for Qualitative and Semiquantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part III: Application to Laser Ablation

✍ Scribed by Cabalin, Luisa Maria; Mermet, Jean-Michel

• Book ID: 115363162
• Publisher: Society for Applied Spectroscopy
• Year: 1997
• Tongue: English
• Weight: 124 KB
• Volume: 51
• Category: Article
• ISSN: 0003-7028
• DOI: 10.1366/0003702971941214