Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

✍ Scribed by Soudier, Luc; Mermet, Jean-Michel

• Book ID: 115362704
• Publisher: Society for Applied Spectroscopy
• Year: 1995
• Tongue: English
• Weight: 693 KB
• Volume: 49
• Category: Article
• ISSN: 0003-7028
• DOI: 10.1366/0003702953965623