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Use of ion beam techniques for studying the leaching properties of lead implanted silicates

✍ Scribed by G. Della Mea; J.-C. Dran; J.-C. Petit; G. Bezzon; C. Rossi-Alvarez

Publisher
Elsevier Science
Year
1983
Weight
422 KB
Volume
218
Category
Article
ISSN
0167-5087

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## Abstract The surface properties of materials are believed to control most of the biological reactions toward implanted materials. To study the surface structure, elemental distribution, and morphology, using transmission electron microscopy (TEM) techniques, thin foils of the surface (in cross‐s