Use of indirectly measured spectra in fundamental parameters X-ray fluorescence analysis
β Scribed by M. Rubio; R.T. Mainardi
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 412 KB
- Volume
- 255
- Category
- Article
- ISSN
- 0168-9002
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π SIMILAR VOLUMES
The results of analyses carried out with the fundamental parameters method without explicit knowledge of the beam exciting the sample are presented. The excitation beam is described by means of the fluorescence produced by a set of thick or thin targets of pure chemical elements. The results are com
X-ray fluorescence (XRF) has been widely used for the elemental analysis in the field of quality control of processes and research since it has the capability of performing non-destructive analysis and requires easy-to-prepare samples. In general, quantitative analysis is carried out by the calibrat