The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering
โฆ LIBER โฆ
Use of coherent optical spatial filtration for improving the quality of x-ray images
โ Scribed by R. I. Utyamyshev; V. I. Adzhalov
- Publisher
- Springer US
- Year
- 1981
- Tongue
- English
- Weight
- 361 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0006-3398
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