Use of cluster secondary ions for minimization of matrix effects in the SIMS depth profiling of La/B4C multilayer nanostructures

✍ Scribed by M. N. Drozdov; Yu. N. Drozdov; M. M. Barysheva; V. N. Polkovnikov; N. I. Chkhalo

• Book ID: 110203312
• Publisher: Pleiades Publishing
• Year: 2010
• Tongue: English
• Weight: 307 KB
• Volume: 4
• Category: Article
• ISSN: 1027-4510
• DOI: 10.1134/s1027451010050216