๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Use of changeover designs in subjective experiments

โœ Scribed by J.A. John

Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
524 KB
Volume
53
Category
Article
ISSN
0022-460X

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Meshing noise effect in design of experi
Meshing noise effect in design of experiments using computer experiments
โœ J. P. Caire; H. Chifflet ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 137 KB

## Abstract This work is intended to show the influence of grid length and meshing technique on the empirical modeling of current distribution in an industrial electroplating reactor. This study confirms the interest of usual DOEs for computer experiments. Any 2D mesh generator induced, in this sen

DESIGN AND ANALYSIS OF INTRA-SUBJECT VAR
DESIGN AND ANALYSIS OF INTRA-SUBJECT VARIABILITY IN CROSS-OVER EXPERIMENTS
โœ VERNON M. CHINCHILLI; JAMES D. ESINHART ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 953 KB

Recently, interest has grown in the development of inferential techniques to compare treatment variabilities in the setting of a cross-over experiment. In particular, comparison of treatments with respect to intrasubject variability has greater interest than has inter-subject variability. We begin w

Analysis of Diallel Table for Experiment
Analysis of Diallel Table for Experiments in Block Designs
โœ Dr. B. Ceranka; Dr. H. Kielczewska ๐Ÿ“‚ Article ๐Ÿ“… 1986 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 410 KB ๐Ÿ‘ 2 views

In this paper the analysis of genotypes obtained in diallel crossing system, including parents, one set of F,'s and reciprocal Fl's, is given. This analysis is presented for data obtained from the experiments laid out in block designs. The analysis of variance, estimator of reciprocal effects, estim

Matching implant doses using design of e
Matching implant doses using design of experiments
โœ Veronica Czitrom; Jesus Casado De Amezua Ayala; Antonio Ros Sanchez ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 143 KB ๐Ÿ‘ 1 views

A designed experiment was performed to match the arsenic implant dose of two implanters during integrated circuit manufacture. Implanter dose mismatch is usually the largest contributor to variability in an important electrical parameter of an integrated circuit, the p-channel transistor threshold v