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Use of capacitance techniques in the study of two-dimensional layers in silicon mosfets

โœ Scribed by R.K. Goodall; R.J. Higgins; J.P. Harrang


Book ID
118985470
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
70 KB
Volume
142
Category
Article
ISSN
0039-6028

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