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Use of capacitance techniques in the study of two-dimensional layers in silicon MOSFETs

โœ Scribed by R.K. Goodall; R.J. Higgins; J.P. Harrang


Book ID
104192259
Publisher
Elsevier Science
Year
1984
Weight
47 KB
Volume
142
Category
Article
ISSN
0167-2584

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