Use of ballistic electron emission microscopy to observe the diversity of fabricated nanometer features at the Au/Si interface

✍ Scribed by Qiu, X.; Shang, G.; Wang, C.; Bai, C.

• Book ID: 113035230
• Publisher: Springer
• Year: 1998
• Tongue: English
• Weight: 227 KB
• Volume: 66
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s003390051107