Use of a semiconductor detector in anomalous (resonance) X-ray scattering measurement of local structure of an amorphous alloy
β Scribed by S. Aur; D. Kofalt; Y. Waseda; T. Egami; H.S. Chen; Boon-Keng Teo; R. Wang
- Publisher
- Elsevier Science
- Year
- 1984
- Weight
- 225 KB
- Volume
- 222
- Category
- Article
- ISSN
- 0167-5087
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