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Use of a semiconductor detector in anomalous (resonance) X-ray scattering measurement of local structure of an amorphous alloy

✍ Scribed by S. Aur; D. Kofalt; Y. Waseda; T. Egami; H.S. Chen; Boon-Keng Teo; R. Wang


Publisher
Elsevier Science
Year
1984
Weight
225 KB
Volume
222
Category
Article
ISSN
0167-5087

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