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Uniform asymptotic expansions of integrals that arise in the analysis of precursors

โœ Scribed by Richard A. Handelsman; Norman Bleistein


Publisher
Springer
Year
1969
Tongue
English
Weight
840 KB
Volume
35
Category
Article
ISSN
0003-9527

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A reliable procedure for the analysis of
โœ M. Hanine; M. Masmoudi; J. Marcon ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 184 KB

In this paper, a reliable procedure, which allows a fine as well as a robust analysis of the deep defects in semiconductors, is detailed. In this procedure where capacitance transients are considered as multiexponential and corrupted with Gaussian noise, our new method of analysis, the Levenberg-Mar