Unification of the time and temperature dependence of dangling-bond-defect creation and removal in amorphous-silicon thin-film transistors

✍ Scribed by Deane, S. C.; Wehrspohn, R. B.; Powell, M. J.

• Book ID: 117997227
• Publisher: The American Physical Society
• Year: 1998
• Tongue: English
• Weight: 98 KB
• Volume: 58
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/physrevb.58.12625