Uncertainty Analysis of Two-Step and Three-Step Methods for Deembedding On-Wafer RF Transistor Measurements

✍ Scribed by Junyoung Cha; Jiyong Cha; Seonghearn Lee

• Book ID: 114619502
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 925 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.926752