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Ultraviolet photoelectron spectroscopy of semiconductor clusters: Silicon and germanium

✍ Scribed by O. Cheshnovsky; S.H. Yang; C.L. Pettiette; M.J. Craycraft; Y. Liu; R.E. Smalley

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 685 KB
Volume: 138
Category: Article
ISSN: 0009-2614
DOI: 10.1016/0009-2614(87)80353-6

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✦ Synopsis

Ultraviolet photoelectron spectra (UPS) are reported here for semiconductor clusters prepared in a supersonic beam. Using a new magnetically focused time-of-flight photoelectron spectrometer, UPS spectra were obtained for mass-selected negative cluster ions of silicon and germanium in the 3-12-atom size range. An ArF excimer laser (6.4 eV) was used for ph~~etachmen~ enabling the first 3-4 eV of the valence band structure of the clusters to be probed. With few exceptions, the UPS data for corresponding clusters of the two semiconductors were remarkably similar. The spectra suggest that clusters 4,6, 7, and 10 of silicon and 4,6 and 7 of germanium are closed-shell species with band saps of 1 to 1.

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