Two-port calibration of test fixtures with different test ports

✍ Scribed by Zhen Yu Chen; You Lin Wang; Yu Liu; Ning Hua Zhu

• Book ID: 102518086
• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 143 KB
• Volume: 35
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/mop.10589

✦ Synopsis

Abstract

The open‐short‐load (OSL) method is very simple and widely used for one‐port test fixture calibration. In this paper, this method is extended, for the first time, to the two‐port calibration of test fixtures with different test ports. The problem of phase uncertainty arising in this application has been solved. The comparison between our results and those obtained with the SOLT method shows that the method established is accurate for practical applications. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 299–302, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10589