๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy

โœ Scribed by Said Hamdioui; Ad J. Van De Goor


Book ID
110262001
Publisher
Springer US
Year
2000
Tongue
English
Weight
131 KB
Volume
16
Category
Article
ISSN
0923-8174

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