Two-dimensional recrystallisation processes of nanometric vanadium oxide thin films grown by atomic layer chemical vapor deposition (ALCVD) evidenced by AFM

✍ Scribed by H. Groult; E. Balnois; A. Mantoux; K. Le Van; D. Lincot

• Book ID: 103817746
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 577 KB
• Volume: 252
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2005.08.014