## Abstract Cutoff frequencies of GaAs MESFETs are simulated by using a model that considers impurity compensation by deep levels in the semiβinsulating (SI) substrate. For a higher acceptor density SI substrate, an achievable cutoff frequency becomes higher because the substrate current becomes sm
β¦ LIBER β¦
Two-dimensional computer analysis of GaAs MESFETs
β Scribed by Xiaoqi Dong; M. El Nokali
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 437 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0038-1101
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