The analysis by XPS of deposited on di โ erent substrates MgO, Ag, SnO) shows the existence of TiO 2 (SiO 2 , shifts in the Ti 2p binding energy and Auger parameter values. The magnitude of these shifts is a function of the support and of the coverage. A systematic representation of these shifts is p
Two-dimensional chemical-state plot for lead using XPS
โ Scribed by L.R. Pederson
- Publisher
- Elsevier Science
- Year
- 1982
- Tongue
- English
- Weight
- 377 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0368-2048
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