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Two-dimensional analysis of the breakdown mechanism in the etched-groove silicon permeable base transistor

✍ Scribed by Mouis, M.

Book ID: 114534645
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 614 KB
Volume: 39
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.141217

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