Two-channel AlGaN/GaN heterostructure field effect transistor for high power applications
✍ Scribed by Gaska, R.; Shur, M. S.; Fjeldly, T. A.; Bykhovski, A. D.
- Book ID
- 111682912
- Publisher
- American Institute of Physics
- Year
- 1999
- Tongue
- English
- Weight
- 318 KB
- Volume
- 85
- Category
- Article
- ISSN
- 0021-8979
- DOI
- 10.1063/1.369621
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
We present the results of the simulation of dc and microwave performance of a GaN/AlGaN heterostructure field effect transistors and compare the results with recent record-breaking experimental data from Cree Research, Inc. Our simulation results are in good agreement with the data on the small sign
## Abstract The influence of strong magnetic field on the 1/__f__ noise in AlGaN/GaN metal‐oxide‐Semiconductor heterostructure field effect transistors (MOSHFETs) has been studied. The independence of 1/__f__ noise on the magnetic fields up to 10 T where the strong geometric magneto‐resistance has