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Tunneling conductance of Al-oxide-Al junctions doped with Ni at the oxide-Al interface

✍ Scribed by M. Barth; K. Keck; H. Sauer

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 235 KB
Volume: 59
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(86)90563-6

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