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Tunnel-induced impact ionization in the metal–thin-insulator-semiconductor–metal system

✍ Scribed by Dixit, P. N. ;Lal, P. ;Srivastava, S. K.

Publisher: John Wiley and Sons
Year: 1975
Tongue: English
Weight: 382 KB
Volume: 30
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210300135

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