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Triple axis diffractometric investigations of the microstructure of thin AlxGa1-xN epitaxial films

✍ Scribed by E. Zielinska-Rohozinska; M. Kowalska; K. Pakuła


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
159 KB
Volume
38
Category
Article
ISSN
0232-1300

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