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Spectroscopic studies of the infrared emission from Tm doped AlxGa1–xN thin films

✍ Scribed by E. Nyein; U. Hömmerich; D. S. Lee; A. J. Steckl; J. M. Zavada


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
188 KB
Volume
2
Category
Article
ISSN
1862-6351

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## Abstract Zn~1–__x__~ Mg__~x~__ O (ZMO) thin films with __x__ = 0, 0.1, 0.2, and 0.3 were prepared on Si(100) substrates by the sol–gel method. The influence of Mg content on the structural and the optical properties was studied by X‐ray diffraction and spectroscopic ellipsometry (SE) in the UV–v