Tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits

✍ Scribed by Rau, J.C.; Jone, W.B.; Chang, S.C.; Wu, Y.L.

• Book ID: 114448440
• Publisher: The Institution of Electrical Engineers
• Year: 2000
• Tongue: English
• Weight: 208 KB
• Volume: 147
• Category: Article
• ISSN: 1350-2387
• DOI: 10.1049/ip-cdt:20000544