Trapped electron and hole distribution mismatch induced reliability degradation of SONOS type memory devices

✍ Scribed by Shi, Guangjian; Pan, Liyang; Sun, Lei; Zhang, Zhigang; Xu, Jun

• Book ID: 108485123
• Publisher: Bioline International
• Year: 2009
• Tongue: English
• Weight: 799 KB
• Volume: 14
• Category: Article
• ISSN: 1007-0214
• DOI: 10.1016/s1007-0214(09)70006-9