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Trap studies in GaInP/GaAs and AlGaAs/GaAs HEMT's by means of low-frequency noise and transconductance dispersion characterizations

โœ Scribed by Yi-Jen Chan; Pavlidis, D.


Book ID
114535686
Publisher
IEEE
Year
1994
Tongue
English
Weight
627 KB
Volume
41
Category
Article
ISSN
0018-9383

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