Trap studies in GaInP/GaAs and AlGaAs/GaAs HEMT's by means of low-frequency noise and transconductance dispersion characterizations

✍ Scribed by Yi-Jen Chan; Pavlidis, D.

• Book ID: 114535686
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 627 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.285009