✦ LIBER ✦
Correlation between trap characterisation by low frequency noise, mutual conductance dispersion, oscillations and DLTS in GaAs MESFETs
✍ Scribed by M.A. Abdala; B.K. Jones
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 718 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0038-1101
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