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Trap Induction and Breakdown Mechanism in SiO2 Films

✍ Scribed by Krause, H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Inter-trap tunnelling in thin SiO2 films

✍ Simeonov, S. ;Yourukov, I. ;Kafedjiiska, E. ;Szekeres, A. 📂 Article 📅 2004 🏛 John Wiley and Sons 🌐 English ⚖ 268 KB

Trapping centres in sputtered SiO2 films

✍ S.W. Wright; J.C. Anderson 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 350 KB

Breakdown of SiO2 films in VLSI MOS stru

✍ J Suñe; I Placencia; E Farrés; N Barniol; X Aymerich 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 394 KB

Breakdown of SiO2 thin films grown in dr

✍ M. Badila; C. Pavelescu; O. Popa 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 243 KB

Anodic growth, dielectric breakdown and

✍ C.R. Fritzsche 📂 Article 📅 1969 🏛 Elsevier Science 🌐 English ⚖ 689 KB

Anodic growth, dielectric breakdown, and

✍ C.R. Fritzsche 📂 Article 📅 1969 🏛 Elsevier Science 🌐 English ⚖ 598 KB