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Inter-trap tunnelling in thin SiO2 films

✍ Scribed by Simeonov, S. ;Yourukov, I. ;Kafedjiiska, E. ;Szekeres, A.

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 268 KB
Volume: 201
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.200406849

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