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Trap-assisted tunneling hole injection in SiO2: Experiment and theory

✍ Scribed by K. A. Nasyrov; S. S. Shaimeev; V. A. Gritsenko

Book ID
111439504
Publisher
Springer
Year
2009
Tongue
English
Weight
244 KB
Volume
109
Category
Article
ISSN
1063-7761

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Trap creation in ultrathin SiO2 films du
Trap creation in ultrathin SiO2 films due to electron injection studied by scanning tunneling microscopy/scanning tunneling spectroscopy
✍ Kenji Ohmori; Shigeaki Zaima; Yukio Yasuda πŸ“‚ Article πŸ“… 2000 πŸ› Elsevier Science 🌐 English βš– 396 KB

## Ε½ . Ε½ . Scanning tunneling microscopy STM and scanning tunneling spectroscopy STS have been employed for the investigation of trap creation in ultrathin SiO films on an atomic scale. Bright spots created by electron injection using 2 STM tips were observed in STM images. The density of bright s