Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

✍ Scribed by Chew-Hoe Ang; Chung-Ho Ling; Byung-Jin Cho; Sun-Jung Kim; Zhi-Yuan Cheng

• Book ID: 111714346
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 597 KB
• Volume: 44
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/s0038-1101(00)00156-8