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Transport Properties of Magnetic Tunnel Junctions Comprising NiFeSiB/CoFeB Hybrid Free Layers

✍ Scribed by Ji Ung Cho; Do Kyun Kim; Tan, R.P.; Isogami, S.; Tsunoda, M.; Takahashi, M.; Young Keun Kim

Book ID: 114653006
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 459 KB
Volume: 45
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.2009.2018574

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