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Bias Voltage Dependence of Magnetic Tunnel Junctions Comprising Double Barriers and CoFe/NiFeSiB/CoFe Free Layer

✍ Scribed by You Song Kim; Byong Sun Chun; Deok-kee Kim; Jae Yeon Hwang; Soon Sub Kim; Rhee, J.R.; Keewon Kim; Taewan Kim; Young Keun Kim

Book ID: 114651461
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 596 KB
Volume: 42
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.2006.879720

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