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Transport properties and hole distribution of Nd(Ba1−xNdx)2Cu3O7+δ

✍ Scribed by R.A.M. van Woerden; D.M. de Leeuw

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
543 KB
Volume
165
Category
Article
ISSN
0921-4534

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The electrical resistivities of thin films of Yl\_xPrxBazCu307 a and Nd~ xCexBazCu307 a have been measured as a function of temperature, magnetic field and concentration x. The p(T, x) behavior of the metastable Ce-doped samples closely follows that of the Pr-doped compounds, suggesting that the dep