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Transport properties and defects in silicon nanoparticles and effect of embedding in amorphous silicon layers

✍ Scribed by M.E. Gueunier-Farret; J.P. Kleider; F. Voigt; R. Brüggemann; G.H. Bauer; F. Huisken; G. Ledoux

No coin nor oath required. For personal study only.

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