Transmission-reflection method for optical constants determination thin absorbing SiOx solid films on silicon substrates

✍ Scribed by M Klanjšek Gunde; B Orel; B Aleksandrov

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 113 KB
• Volume: 40
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(90)90219-o