Improvement of breakdown characteristics
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Yu, Hongbo ;Lisesivdin, Sefer B. ;Bolukbas, Basar ;Kelekci, Ozgur ;Ozturk, Musta
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Article
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2010
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John Wiley and Sons
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English
⚖ 381 KB
## Abstract To improve the breakdown characteristics of an AlGaN/GaN based high electron mobility transistor (HEMT) for high voltage applications, AlGaN/GaN/Al~__x__~Ga~1−__x__~N double heterostructure (DH‐HEMTs) were designed and fabricated by replacing the semi‐insulating GaN buffer with content