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Transmission-electron microscopy study of ion-beam implanted single-crystal ceramics

✍ Scribed by M.Grant Norton; Elizabeth L. Fleischer; William Hertl; C.Barry Carter; James W. Mayer

Book ID
113282028
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
378 KB
Volume
59-60
Category
Article
ISSN
0168-583X

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## Abstract Single crystal MgO specimens having low load Vickers indentations were thinned in an ion milling machine employing a single ion gun, and their characteristics were investigated with optical microscopy and high voltage electron microscopy (HVEM). It was found that the state of cleanlines