✦ LIBER ✦

Transmission electron microscopy on helium implanted niobium tensile specimens

✍ Scribed by L.A. Charlot; J.L. Brimhall; D.G. Atteridge

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 562 KB
Volume: 66
Category: Article
ISSN: 0022-3115
DOI: 10.1016/0022-3115(77)90150-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The preparation of cross-sectional trans

The preparation of cross-sectional transmission electron microscopy specimens of Nb/Al multilayer thin films on sapphire substrates

✍ Barmak, Katayun ;Rudman, David A. ;Foner, Simon 📂 Article 📅 1990 🏛 Wiley (John Wiley & Sons) 🌐 English ⚖ 607 KB

## Abstract We have developed a technique for preparation of cross‐sectional transmission electron microscopy samples of reacted and unreacted Nb/al multilayer thin films on sapphire substrates. The choice of substrate was found to be extremely important. Sapphire sputters more slowly than Nb and N

On the annealing behaviour of dysprosium

On the annealing behaviour of dysprosium ion implanted nickel: A combined study using Rutherford backscattering, transmission electron microscopy, and total current spectroscopy

✍ L.T. Chadderton; E. Johnson; S.A. Komolov 📂 Article 📅 1978 🏛 Elsevier Science ⚖ 785 KB