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Transmission electron microscopy investigation of the microstructure and chemistry of Si/Cu/In/Cu/Si interconnections

✍ Scribed by S. Sommadossi; L. Litynska; P. Zieba; W. Gust; E.J. Mittemeijer


Book ID
114193549
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
94 KB
Volume
81
Category
Article
ISSN
0254-0584

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