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Direct Observation of Interfaces and Microstructures in GaAs/Si and GaAs/Ga1−xAlxAs/Si by Transmission Electron Microscopy

✍ Scribed by Wu, X. J. ;Li, F. H. ;Hou, H. Q. ;Zhou, J. M. ;Hashimoto, H.


Book ID
105382034
Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
955 KB
Volume
119
Category
Article
ISSN
0031-8965

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