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Transmission electron microscopy, electron diffraction and hardness studies of high-pressure and high-temperature treated C 60

✍ Scribed by Wood, R A; Lewis, M H; West, G; Bennington, S M; Cain, M G; Kitamura, N

Book ID: 120446445
Publisher: Institute of Physics
Year: 2000
Tongue: English
Weight: 319 KB
Volume: 12
Category: Article
ISSN: 0953-8984
DOI: 10.1088/0953-8984/12/50/304

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