𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Transmission electron microscopy characterization of the deformation of CdZnTe single crystals induced by nanoscratching

✍ Scribed by Y.Q. Wu; H. Huang; J. Zou


Book ID
113899046
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
572 KB
Volume
65
Category
Article
ISSN
1359-6462

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Investigation of crystal lattice defects
✍ A. A. Dobrikov; Dr. O. V. Presnyakova πŸ“‚ Article πŸ“… 1980 πŸ› John Wiley and Sons 🌐 English βš– 329 KB

## Abstract The investigation of PbZrO~3~ single crystal structure was carried out by the method of transmission electron microscopy (TEM). It is shown that extended planar defects, slip lines, twins, and moriΓ© patterns are observed in PbZrO~3~.

Characterization of the microstructure o
✍ M.F. Denanot; J. Rabier πŸ“‚ Article πŸ“… 1989 πŸ› Elsevier Science 🌐 English βš– 407 KB

Aluminium nitride samples sintered with various Y20: concentrations are characterized by transmission electron microscopy. Topology and second phase characteristics at grain boundaries are investigated by X-ray and diffraction experiments. At low Y:O~ concentrations (up to 10%) second phases (mainly