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Transmission electron microscopy characterization of HfO2/GaAs(001) heterostructures grown by molecular beam epitaxy

✍ Scribed by S.C. Liou; M.-W. Chu; C.H. Chen; Y.J. Lee; P. Chang; W.C. Lee; M. Hong; J. Kwo

No coin nor oath required. For personal study only.

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